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X-Ray Diffractometers

The possibility of using powder diffraction methods to study materials was recognized shortly after the discovery of X-ray diffraction by von Laüe and Knipping in 1910. In particular, the construction of a simple powder diffractometer was described by Hull in 1917, and the instrument was used to obtain patterns from a number of simple materials such as diamond, graphite and iron. Within a few years, many others, including the Braggs and Pauling, had exploited the powder method to study a wide range of materials, including metals, minerals, and simple organic solids.

The power of powder techniques is such that they have had an impact in most of the major developments in the field of new materials during recent years - with solid electrolytes, high-temperature superconductors, fullerenes, zeolites and giant magnetoresistance (GMR) materials being obvious examples. As a consequence, powder diffraction has been transformed into one of the most exciting areas in scientific instrumentation.

 

ULTIMA IV

The Ultima IV represents the state of the art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements...fast.

SMARTLAB

Powered by Rigaku's proprietary Guidance™ software system, SmartLab incorporates intelligent, application-specific protocols in all measurement types, enhancing new or inexperienced users' abilities to make quality measurements with a minimal learning curve. For advanced users, the automated methods offer greater throughput and productivity.

D/MAX-RAPID

Rigaku makes another breakthrough with the D/MAX-RAPID microdiffraction system. The curved image plate technology offers high-sensitivity, high-resolution, high-speed and large area compared with multiwire and CCD technology.

TTRAX

The q/q goniometer system, TTRAX, is the world's first diffraction system specifically designed to incorporate the 18 kW rotating anode X-ray high power X-ray generator into the q/q configuration. With this system, the sample surface is always maintained horizontal while the rotating anode X-ray source and the detector each move in q/q rotations about the sample. Thus, the system permits measurement of free liquid surfaces of materials including room temperature liquids and substances in their molten state (by heating in a high temperature attachment).

XRD-DSC

Simultaneous XRD and DSC for Pharmaceutical Applications

MSF/PSF-3M

Position Sensitive Detector X-ray Stress Analyzer

APPLICATION ATACHMENTS

 
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