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X-Ray Diffractometers

The possibility of using powder diffraction methods to study materials was recognized shortly after the discovery of X-ray diffraction by von Laüe and Knipping in 1910. In particular, the construction of a simple powder diffractometer was described by Hull in 1917, and the instrument was used to obtain patterns from a number of simple materials such as diamond, graphite and iron. Within a few years, many others, including the Braggs and Pauling, had exploited the powder method to study a wide range of materials, including metals, minerals, and simple organic solids.

The power of powder techniques is such that they have had an impact in most of the major developments in the field of new materials during recent years - with solid electrolytes, high-temperature superconductors, fullerenes, zeolites and giant magnetoresistance (GMR) materials being obvious examples. As a consequence, powder diffraction has been transformed into one of the most exciting areas in scientific instrumentation.

 

MiniFlex 300/600

Best-in-class benchtop powder X-ray diffraction system for qualitative and quantitative phase analysis of poly-crystalline materials.

SmartLabŪ

Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

SmartLab SE

ULTIMA IV

The Ultima IV represents the state of the art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements...fast.

D/MAX-RAPID

Rigaku makes another breakthrough with the D/MAX-RAPID microdiffraction system. The curved image plate technology offers high-sensitivity, high-resolution, high-speed and large area compared with multiwire and CCD technology.

TTRAX

The q/q goniometer system, TTRAX, is the world's first diffraction system specifically designed to incorporate the 18 kW rotating anode X-ray high power X-ray generator into the q/q configuration. With this system, the sample surface is always maintained horizontal while the rotating anode X-ray source and the detector each move in q/q rotations about the sample. Thus, the system permits measurement of free liquid surfaces of materials including room temperature liquids and substances in their molten state (by heating in a high temperature attachment).

XRD-DSC

Simultaneous XRD and DSC for Pharmaceutical Applications

MSF/PSF-3M

Position Sensitive Detector X-ray Stress Analyzer

APPLICATION ATACHMENTS

 
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